Emitter-ballasting-resistor-free SiGe microwave power heterojunction bipolar transistor

被引:9
|
作者
Zhang, JS [1 ]
Jia, HY
Tsien, PH
Lo, TC
机构
[1] Tsinghua Univ, Inst Microelect, Beijing 100084, Peoples R China
[2] Hong Kong Univ Sci & Technol, Dept Elect & Elect Engn, Hong Kong, Peoples R China
关键词
D O I
10.1109/55.772365
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The emitter ballasting resistor is used to equalize the current distribution between the emitter stripes in pou er transistor, but it will degrade the output power, power gain, and power added efficiency. Experimental result indicates that the current gain of uniform-base SiGe heterojunction bipolar transistors (HBT's) decreases with the increase of the temperature above temperature of 160 K, so the current distribution is equalized by itself to some extent. Therefore, the microwave pow er SiGe HBT's without emitter ballasting resistor were fabricated for the first time, and the continuous output power of 5 W and power added efficiency of 63% were obtained under Class C operation at frequency of 900 MHz. Hence, the emitter current density of the SiGe HBT's with emitter width of 6 mu m is 0.79 A/cm.
引用
收藏
页码:326 / 328
页数:3
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