Co-located Accelerated Testing of Module Level Power Electronics and Associated PV Panels

被引:0
作者
Flicker, Jack [1 ]
Lavrova, Olga [1 ]
Tamizhmani, Govindasamy [2 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87105 USA
[2] Arizona State Univ, Photovolta Reliabil Lab, Mesa, AZ 85212 USA
来源
2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC) | 2018年
关键词
materials reliability; photovoltaic systems; solar panels; power electronics; DC-AC power converters;
D O I
暂无
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
In order to study the relative degradation between co-located PV modules and microinverters in an ACPV configuration, four 260 Watt PV modules and four 250 W microinverters purchased on the open market have been co-located in a thermal chamber set at a static temperature (69 degrees C). Instantaneous electrical/thermal measurements have been taken on the microinverters with periodic dark IV measurements on the modules. After over 10,000 hours of testing, no failures or observable degradation have been seen in either the module or microinverter. Using average measured field-temperature data with Military Handbook analysis, this indicates an approximate field use of 44 years of operation lifetime for PV modules, and 13 years of operation for microinverters with reliability of 66.87% with a lower one-sided confidence level of 80%.
引用
收藏
页码:1273 / 1277
页数:5
相关论文
共 4 条
[1]  
[Anonymous], 1991, Military Handbook: Reliability Prediction of Electronic Equipment: MILHDBK- 217F, Department of Defense
[2]   Using reliability modeling and accelerated life testing to formulate a cost model of photovoltaic systems with different architectures [J].
Caldwell, Wendel ;
Parker, T. Paul ;
Hasselbrink, Charlie .
INTERNATIONAL CONFERENCE ON MATERIALS FOR ADVANCED TECHNOLOGIES (ICMAT2015), SYMPOSIUM C - SOLAR PV (PHOTOVOLTAICS) MATERIALS, MANUFACTURING AND RELIABILITY, 2016, 139 :155-160
[3]   Accelerated Testing of Module-Level Power Electronics for Long-Term Reliability [J].
Flicker, Jack ;
Tamizhmani, Govindasamy ;
Moorthy, Mathan Kumar ;
Thiagarajan, Ramanathan ;
Ayyanar, Raja .
IEEE JOURNAL OF PHOTOVOLTAICS, 2017, 7 (01) :259-267
[4]  
Guo H., METHOD RELIABILITY A, P1