From the Binet-Simon to the Wechsler-Bellevue: Tracing the history of intelligence testing

被引:101
作者
Boake, C
机构
[1] TIRR, Houston, TX 77030 USA
[2] Univ Texas, Sch Med, Dept Phys Med & Rehabil, Houston, TX USA
关键词
D O I
10.1076/jcen.24.3.383.981
中图分类号
B849 [应用心理学];
学科分类号
040203 ;
摘要
The history of David Wechsler's intelligence scales is reviewed by tracing the origins of the subtests in the 1939 Wechsler-Bellevue Intelligence Scale. The subtests originated from tests developed between 1880 and World War I, and was based on approaches to mental testing including anthropometrics, association psychology, the Binet-Simon scales, language-free performance testing of immigrants and school children, and group testing of military recruits. Wechsler's subtest selection can be understood partly from his clinical experiences during World War I. The structure of the Wechsler-Bellevue Scale, which introduced major innovations in intelligence testing, has remained almost unchanged through later revisions.
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页码:383 / 405
页数:23
相关论文
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