Measuring daily Value-at-Risk of SSEC index: A new approach based on multifractal analysis and extreme value theory

被引:18
作者
Wei, Yu [1 ]
Chen, Wang [1 ]
Lin, Yu [2 ]
机构
[1] Southwest Jiaotong Univ, Sch Econ & Management, Chengdu, Peoples R China
[2] Chengdu Univ Technol, Commercial Coll, Chengdu, Peoples R China
基金
中国国家自然科学基金;
关键词
Multifractal analysis; Volatility measurement; Extreme value theory; Value-at-Risk; Backtesting; CROSS-CORRELATION ANALYSIS; LONG-RANGE DEPENDENCE; CHINESE STOCK-MARKET; VOLATILITY MODELS; ASSET RETURNS; TIME-SERIES; BEHAVIOR; VOLUME; PERFORMANCE; COMPONENTS;
D O I
10.1016/j.physa.2013.01.032
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Recent studies in the econophysics literature reveal that price variability has fractal and multifractal characteristics not only in developed financial markets, but also in emerging markets. Taking high-frequency intraday quotes of the Shanghai Stock Exchange Component (SSEC) Index as example, this paper proposes a new method to measure daily Value-at-Risk (VaR) by combining the newly introduced multifractal volatility (MFV) model and the extreme value theory (EVT) method. Two VaR backtesting techniques are then employed to compare the performance of the model with that of a group of linear and nonlinear generalized autoregressive conditional heteroskedasticity (GARCH) models. The empirical results show the multifractal nature of price volatility in Chinese stock market. VaR measures based on the multifractal volatility model and EVT method outperform many GARCH-type models at high-risk levels. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:2163 / 2174
页数:12
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