Practical considerations for high-speed X-ray pixel array detectors and X-ray sensing materials

被引:9
作者
Philipp, H. T. [1 ]
Tate, M. W. [1 ]
Shanks, K. S. [1 ]
Purohit, P. [1 ]
Gruner, S. M. [1 ,2 ,3 ]
机构
[1] Cornell Univ, Lab Atom & Solid State Phys, Ithaca, NY 14853 USA
[2] Cornell Univ, CHESS, Ithaca, NY 14853 USA
[3] Cornell Univ, Kavli Inst Cornell Nanoscale Sci, Ithaca, NY 14853 USA
基金
美国国家科学基金会;
关键词
Pixel array detector; X-ray camera; CMOS camera; Silicon detector; CdTe; Germanium;
D O I
10.1016/j.nima.2019.01.066
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Advances in synchrotron light sources are creating new opportunities for scientific discovery by producing intense, low-emittance pulses of X-ray illumination. Detectors play a critical link in the experimental process because they are the tools of observation, charged with providing quantitative records of events that are the product of experiments. The capabilities of X-ray imaging detectors often limit the experimental possibilities, and dedicated development is needed to meet source capabilities. Currently, challenging demands on imaging detectors include hard X-ray imaging (e.g., > 25 keV), high-speed imaging (e.g. matching X-ray pulse rates), and high dynamic range imaging. Pixel Array Detector (PAD) development efforts at Cornell aiming to meet these demands are described, including high atomic number (high-Z) sensor materials, single bunch imaging, high-speed continuous acquisition, and high dynamic range imaging. This paper discusses detector design considerations and development efforts at Cornell.
引用
收藏
页码:18 / 23
页数:6
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