Detection of nanosecond-scale, high power THz pulses with a field effect transistor

被引:21
作者
Preu, S. [1 ,2 ,3 ,4 ]
Lu, H. [3 ]
Sherwin, M. S. [1 ,2 ]
Gossard, A. C. [3 ]
机构
[1] Univ Calif Santa Barbara, Dept Phys, Santa Barbara, CA 93106 USA
[2] Univ Calif Santa Barbara, Inst Terahertz Sci & Technol, Santa Barbara, CA 93106 USA
[3] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA
[4] Univ Erlangen Nurnberg, Chair Appl Phys, D-91058 Erlangen, Germany
关键词
TERAHERTZ; GENERATION;
D O I
10.1063/1.4705986
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We demonstrate detection and resolution of high power, 34 ns free electron laser pulses using a rectifying field effect transistor. The detector remains linear up to an input power of 11 +/- 0.5 W at a pulse energy of 20 +/- 1 mu J at 240 GHz. We compare its performance to a protected Schottky diode, finding a shorter intrinsic time constant. The damage threshold is estimated to be a few 100 W. The detector is, therefore, well-suited for characterizing high power THz pulses. We further demonstrate that the same detector can be used to detect low power continuous-wave THz signals with a post detection limited noise floor of 3.1 mu W/root Hz. Such ultrafast, high power detectors are important tools for high power and high energy THz facilities such as free electron lasers. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4705986]
引用
收藏
页数:6
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