A Monte Carlo simulation model for surface evolution by plasma etching

被引:4
作者
Chen, Fangfang [1 ]
Zhu, Kaigui [1 ]
Chen, Aqing [1 ]
Huang, Weijie [1 ]
Feng, Lishuang [2 ]
Zhou, Zhen [2 ]
Ge, Guanglu [3 ]
机构
[1] Beihang Univ, Dept Phys, Beijing 100191, Peoples R China
[2] Beihang Univ, Sch Instrumentat Sci & Optoelect Engn, Beijing 100191, Peoples R China
[3] Natl Ctr Nanosci & Technol, Lab Nanostanderizat, Beijing 100190, Peoples R China
基金
中国国家自然科学基金;
关键词
Plasma etching; Surface morphology; Simulation; Monte Carlo method; GROWTH;
D O I
10.1016/j.apsusc.2013.04.171
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A Monte Carlo simulation model, i.e. sputtering etch model, was established with Monte Carlo method to simulate plasma etching induced surface morphology evolution. The surface morphology images and fractal exponents were obtained, with alpha = 0.5, beta = 0.27, z = 1.76. Germanium samples were etched in SF6 plasma and the post-etch surface was analyzed in order to compare with the model. The surface morphology images and fractal exponents by simulation describe the experimental results very well. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:655 / 659
页数:5
相关论文
共 18 条
[1]  
[Anonymous], 1995, FRACTAL CONCEPT SURF, DOI DOI 10.1017/CBO9780511599798
[2]   Monte Carlo simulation of vapor deposition polymerization [J].
Bowie, W ;
Zhao, YP .
SURFACE SCIENCE, 2004, 563 (1-3) :L245-L250
[3]   Modeling of roughness evolution during the etching of inhomogeneous films: Material-induced anomalous scaling [J].
Constantoudis, V. ;
Christoyianni, H. ;
Zakka, E. ;
Gogolides, E. .
PHYSICAL REVIEW E, 2009, 79 (04)
[4]   Surface roughening in shadowing growth and etching in 2+1 dimensions [J].
Drotar, JT ;
Zhao, YP ;
Lu, TM ;
Wang, GC .
PHYSICAL REVIEW B, 2000, 62 (03) :2118-2125
[5]   Mechanisms for plasma and reactive ion etch-front roughening [J].
Drotar, JT ;
Zhao, YP ;
Lu, TM ;
Wang, GC .
PHYSICAL REVIEW B, 2000, 61 (04) :3012-3021
[6]   Growth-front roughening in amorphous silicon films by sputtering [J].
Karabacak, T ;
Zhao, YP ;
Wang, GC ;
Lu, TM .
PHYSICAL REVIEW B, 2001, 64 (08)
[7]   A study of GaN etch mechanisms using inductively coupled Cl2/Ar plasmas [J].
Kim, HS ;
Yeom, GY ;
Lee, JW ;
Kim, TI .
THIN SOLID FILMS, 1999, 341 (1-2) :180-183
[8]   Kinetic roughening of ion-sputtered Pd(001) surface: Beyond the Kuramoto-Sivashinsky model [J].
Kim, TC ;
Ghim, CM ;
Kim, HJ ;
Kim, DH ;
Noh, DY ;
Kim, ND ;
Chung, JW ;
Yang, JS ;
Chang, YJ ;
Noh, TW ;
Kahng, B ;
Kim, JS .
PHYSICAL REVIEW LETTERS, 2004, 92 (24) :246104-1
[9]   Dual nanoscale roughness on plasma-etched Si surfaces: Role of etch inhibitors [J].
Kokkoris, G. ;
Constantoudis, V. ;
Angelikopoulos, P. ;
Boulousis, G. ;
Gogolides, E. .
PHYSICAL REVIEW B, 2007, 76 (19)
[10]   Growth mechanisms of vapor-born polymer films [J].
Lee, I. J. ;
Yun, Mira ;
Lee, Sang-Min ;
Kim, Ja-Yeon .
PHYSICAL REVIEW B, 2008, 78 (11)