Online Non-contact Fault Detection of LED Chips

被引：2
作者：
Li, Lian [1 ]
Wen, Jing [1 ]
Li, Ping [1 ]
Wen, Yumei [1 ]
Yin, Fei [1 ]
机构：
[1] Chongqing Univ, Coll Optoelect Engn, Key Lab Optoelect Technol & Syst, Minist Educ, Chongqing 630044, Peoples R China
来源：
2008 7TH WORLD CONGRESS ON INTELLIGENT CONTROL AND AUTOMATION, VOLS 1-23 | 2008年
关键词：
LED; non-contact detection; online detection; photovoltaic effect; packaging;
D O I：
10.1109/WCICA.2008.4592937
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
An online non-contact fault detection Method of LED chips is presented based on the photovoltaic effect in diodes. By observing the photo-generated current in the bonding lead frame of a LED chip, the LED chip and its electric connection with the lead frame during packaging are checked. The fault detection principle is described in detail in this paper. By using the method based on the law of electromagnetic induction, the photo-generated current can be measured without any touch. The experimental results show that the method can be easily realized, and thus can be used for online fault detection of LED chips in packaging.
引用
收藏
页码：280 / 283
页数：4
相关论文
共 18 条
  • [11] Design of wireless on-wafer submicron characterization system
    Moore, B
    Margala, M
    Backhouse, C
    [J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2005, 13 (02) : 169 - 180
  • [12] On the measurement of high resistance semiconductors by the van der Pauw method
    Morvic, M
    [J]. ASDAM 2000: THIRD INTERNATIONAL EUROCONFERENCE ON ADVANCED SEMICONDUCTOR DEVICES AND MICROSYSTEMS - CONFERENCE PROCEEDINGS, 2000, : 327 - 330
  • [13] RAGHUNATHAN R, 1996, POW SEM DEV ICS 1996, P111
  • [14] LBIC analysis of thin-film polycrystalline solar cells
    Sites, JR
    Nagle, TJ
    [J]. Conference Record of the Thirty-First IEEE Photovoltaic Specialists Conference - 2005, 2005, : 199 - 204
  • [15] Ward D. A., 1993, Engineering Science and Education Journal, V2, P105, DOI 10.1049/esej:19930034
  • [16] Determination of material parameters from regions close to the collector using electron beam-induced current
    Wu, DT
    Ong, VKS
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (08) : 1455 - 1461
  • [17] ZHAO KH, 2001, ELECTROMAGNETICS, P618
  • [18] The life and times of the LED - a 100-year history
    Zheludev, Nikolay
    [J]. NATURE PHOTONICS, 2007, 1 (04) : 189 - 192
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