Fabrication of YSZ thin-film for SOFC applied by electron beam PVD

被引：1
作者：
Shin, Tae Ho [1 ]
Yu, Ji Heang
Lee, Shiwoo
Han, In Sub
Seo, Doo Won
Hong, Ki Sulk
Woo, Sang Kuk
Hyun, Sang-Hoon
机构：
[1] Yonsei Univ, Dept Ceram Engn, Seoul 120749, South Korea
[2] Korea Inst Energy Res, Energy Mat Res Ctr, Taejon 305345, South Korea
来源：
ECO-MATERIALS PROCESSING & DESIGN VII | 2006年 / 510-511卷
关键词：
solid electrolyte; YSZ film; electron beam PVD; electrical conductivity;
D O I：
10.4028/www.scientific.net/MSF.510-511.1114
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Thin film of yttria stabilized zirconia (YSZ) was prepared on alumina substrates by applying an electron beam physical vapor deposition (EB-PVD) method. The morphology and deposition behavior of the coating layer were investigated using atomic force microscope, secondary electron microscope, and X-ray difractometer. The electrical conductivity of the YSZ coating layer was also evaluated. The fracture microstructure of YSZ electrolyte film, which was deposited with thickness of 10 mu m, has showed a columnar structure. Also, the activation energy of the coating layer was similar to that of bulk YSZ.
引用
收藏
页码：1114 / 1117
页数：4
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