Bio-Inspired Methods for Defect-Tolerant Function-Mapping in Nano-Crossbar Arrays

被引:0
作者
Kule, Malay [1 ]
Rahaman, Habibur [2 ]
Rahaman, Hafizur [1 ]
Bhattacharya, Bhargab B. [2 ]
机构
[1] Indian Inst Engn Sci & Technol, Dept Comp Sci & Technol, Howrah 711103, India
[2] Indian Inst Technol Kharagpur, Dept Comp Sci & Engn, Kharagpur 721302, India
关键词
Nanoscale; lithography; crossbar; nanowires; genetic algorithm; particle swarm optimization; LOGIC;
D O I
10.1080/03772063.2022.2143434
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nanoscale chips inherently suffer from higher defect densities than traditional lithography-based VLSI designs. So defect tolerant designs are required at this scale. Mapping different functions in a very large nanoscale crossbar containing defective cross-points is a hard searching problem. In this work, we studied traditional sorting-based methods followed by two other proposed approaches based on Genetic Algorithm (GA) and Particle Swarm Optimization (PSO) to find a proper assignment of different functions in the nanoscale crossbar circuit having defective cross-points. The objective of the proposed algorithm is to map a very large number of functions within the very large size defective-crossbar if there exists any solution. The number of generations required to get a solution may vary depending on the position of defect points and on-inputs of the functions inspite of having the same defect percentage. Our proposed methods based on GA and PSO work more efficiently with the increase of number of functions, crossbar area and defect percentage in comparison with the traditional sorting-based methods. Experimental results show that our meta-heuristic-based approaches outperform the earlier sorting-based approaches in terms of mapping success percentage.
引用
收藏
页码:1861 / 1870
页数:10
相关论文
共 16 条
  • [1] The future of nanocomputing
    Bourianoff, G
    [J]. COMPUTER, 2003, 36 (08) : 44 - +
  • [2] Molecular electronics: Devices, systems and tools for gigagate, gigabit chips
    Butts, M
    DeHon, A
    Goldstein, SC
    [J]. IEEE/ACM INTERNATIONAL CONFERENCE ON CAD-02, DIGEST OF TECHNICAL PAPERS, 2002, : 433 - 440
  • [3] DeHon A., 2004, Intl. Symp. on Field- Programmable Gate Arrays, P123
  • [4] Goldberg D., 1989, Genetic algorithms in Search
  • [5] Hogg T, 2007, J ELECTRON TEST, V23, P117, DOI [10.1007/s10836-006-0547-7, 10.1007/S10836-006-0547-7]
  • [6] Function-mapping on defective nano-crossbars with enhanced reliability
    Kule, Malay
    Rahaman, Hafizur
    Bhattacharya, Bhargab B.
    [J]. JOURNAL OF COMPUTATIONAL ELECTRONICS, 2020, 19 (02) : 555 - 564
  • [7] Maximal Defect-Free Component in Nanoscale Crossbar Circuits Amidst Stuck-Open and Stuck-Closed Faults
    Kule, Malay
    Rahaman, Hafizur
    Bhattacharya, Bhargab B.
    [J]. JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, 2019, 28 (11)
  • [8] Kule M, 2016, 2016 SIXTH INTERNATIONAL SYMPOSIUM ON EMBEDDED COMPUTING AND SYSTEM DESIGN (ISED 2016), P77, DOI 10.1109/ISED.2016.7977058
  • [9] Kule M, 2016, PROCEEDINGS OF 2016 IEEE INTERNATIONAL CONFERENCE ON DISTRIBUTED COMPUTING, VLSI, ELECTRICAL CIRCUITS AND ROBOTICS (DISCOVER), P47, DOI 10.1109/DISCOVER.2016.7806231
  • [10] On Finding a Defect-Free Component in Nanoscale Crossbar Circuits
    Kule, Malay
    Rahaman, Hafizur
    Bhattacharya, Bhargab B.
    [J]. PROCEEDINGS OF THE 4TH INTERNATIONAL CONFERENCE ON ECO-FRIENDLY COMPUTING AND COMMUNICATION SYSTEMS, 2015, 70 : 421 - 427