Plasma limiter for protecting against high power microwave
被引:0
作者:
Yang, Geng
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机构:
Natl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R ChinaNatl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R China
Yang, Geng
[1
]
Tan, Ji-chun
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机构:
Natl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R ChinaNatl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R China
Tan, Ji-chun
[1
]
Shem, Ding-yi
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h-index: 0
机构:
Natl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R ChinaNatl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R China
Shem, Ding-yi
[1
]
Yang, Yu-chuan
论文数: 0引用数: 0
h-index: 0
机构:
Natl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R ChinaNatl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R China
Yang, Yu-chuan
[1
]
机构:
[1] Natl Univ Def Technol, Coll Sci, Tech Phys Res Inst, Changsha, Hunan, Peoples R China
来源:
JOURNAL OF SCIENTIFIC & INDUSTRIAL RESEARCH
|
2008年
/
67卷
/
09期
关键词:
electronic systems;
high power microwave;
plasma limiter;
D O I:
暂无
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Breakdown parameters of plasma limiter are calculated to find new measure to protect electronic systems against high Power microwave (HPM). Limiter filled with Xe of 1 torr can be charged by incident HPM in approximate 14 ns, providing protection to electronic systems.