An effective method to minimize the leakage current in organic thin-film transistors by using blends of various molecular weights
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作者:
Kim, Hyeok
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Univ Paris 07, ITODYS, CNRS, F-75205 Paris, France
Seoul Natl Univ, Sch Elect Engn 32, Seoul 151600, South KoreaUniv Paris 07, ITODYS, CNRS, F-75205 Paris, France
Kim, Hyeok
[1
,3
]
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Bae, Jin-Hyuk
[2
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Lee, Sin-Doo
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Seoul Natl Univ, Sch Elect Engn 32, Seoul 151600, South KoreaUniv Paris 07, ITODYS, CNRS, F-75205 Paris, France
Lee, Sin-Doo
[3
]
Horowitz, Gilles
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Univ Paris 07, ITODYS, CNRS, F-75205 Paris, FranceUniv Paris 07, ITODYS, CNRS, F-75205 Paris, France
Horowitz, Gilles
[1
]
机构:
[1] Univ Paris 07, ITODYS, CNRS, F-75205 Paris, France
[2] Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, Taegu 702701, South Korea
[3] Seoul Natl Univ, Sch Elect Engn 32, Seoul 151600, South Korea
We report on an effective method to minimize the leakage current in an organic thin-film transistor (OTFT) by using a polymeric gate insulator, poly(vinyl phenol) (PVP). When the molecular weight (M-w) of the PVP varies, only the leakage current is affected under constant remaining electrical parameters. More importantly, through a binary mixing between two different M-w, it is found that the leakage current can be minimized. This is attributed to a reduction of the free volume in the blended PVP layer, leading to a more vigorous cross-linking reaction, as compared to a single molecular weight PVP. (C) 2012 Elsevier B.V. All rights reserved.
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Lim, Sang Chul
Kim, Seong Hyun
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Kim, Seong Hyun
Koo, Jae Bon
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Koo, Jae Bon
Lee, Jung Hun
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Lee, Jung Hun
Ku, Chan Hoe
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Ku, Chan Hoe
Yang, Yong Suk
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Yang, Yong Suk
Zyung, Taehyoung
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
机构:
Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Lim, Sang Chul
Kim, Seong Hyun
论文数: 0引用数: 0
h-index: 0
机构:
Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Kim, Seong Hyun
Koo, Jae Bon
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Koo, Jae Bon
Lee, Jung Hun
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Lee, Jung Hun
Ku, Chan Hoe
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Ku, Chan Hoe
Yang, Yong Suk
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea
Yang, Yong Suk
Zyung, Taehyoung
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Elect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South KoreaElect & Telecommun Res Inst, IT Convergence & Components Lab, Taejon 305350, South Korea