Analysis of Key Interference Sources Affecting CCD Measurement Accuracy

被引：0
|
作者：
Chen Donggen [1 ]
Xu Jiangtao [2 ]
Liu Hongwei [3 ]
Cui Kaibo [1 ]
机构：
[1] Mech Engn Coll, Shijiazhuang, Hebei, Peoples R China
[2] Unit 63981, Wuhan, Hubei, Peoples R China
[3] Unit 63983, Wuxi, Jiangsu, Peoples R China
来源：
2016 IEEE INFORMATION TECHNOLOGY, NETWORKING, ELECTRONIC AND AUTOMATION CONTROL CONFERENCE (ITNEC) | 2016年
关键词：
linear CCD; accuracy; interference sources; stray light;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In actual field test environments, unstable CCD measuring spot center position, the total appears slight shaking, so that measurements and calculated spot position and displacement there is a big error. This paper studies the field environments offline Array CCD measurement technology characteristics, analyzes the key sources of interference affecting the measurement accuracy linear CCD, combined with the test environment design solutions.
引用
收藏
页码：1018 / 1021
页数：4
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