EXAFS spectroscopy at synchrotron-radiation beams

被引:0
作者
Aksenov, VL [1 ]
Kuzmin, AY
Purans, J
Tyutyunnikov, SI
机构
[1] Joint Inst Nucl Res, Dubna 141980, Moscow Oblast, Russia
[2] Latvian State Univ, Inst Solid State Phys, LV-226063 Riga, Latvia
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中图分类号
O412 [相对论、场论]; O572.2 [粒子物理学];
学科分类号
摘要
Development of the specialized synchrotron radiation (SR) sources of high brightness affords considerable advancement in using absorption-spectroscopy methods for determining the local atomic and electronic structure of absorbing centers in materials science, physics, chemistry, and biology. This review presents the basic theoretical principles of extended x-ray absorption fine structure (EXAFS) spectroscopy, which is one of the mainstream directions of absorption spectroscopy and allows high-accuracy determination of the parameters of the short-range order in multicomponent amorphous and quasicrystalline substances. Methods of analyzing EXAFS spectra with allowance for multiple-scattering effects are described along with experimental procedures implementing EXAFS spectroscopy at SR beams and requirements to the monochromatization. of the radiation beam. An energy-dispersive spectrometer, which can provide the time resolution 3-5 ms, is under development at the SR beam at Kurchatov Institute for studying phase transitions and external actions to an object. The EXAFS-spectroscopy results for oxide compounds of tungsten and molybdenum, whose valence varies in dependence of external actions, are presented. One of the structural problems of the physics of fullerenes - temperature dependence of the position of metal atoms-is successfully solved by using EXAFS spectroscopy.
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页码:675 / 707
页数:33
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