High-resolution gamma backscatter imaging for technical applications

被引：17

作者：

Gerl, J

Ameil, F

Kojouharov, I

Surowiec, A

机构：

[1] Gesell Schwerionenforsch mbH GSI, D-64291 Darmstadt, Germany

[2] Gesell Forsch & Entwicklungsserv mbH GFE, D-64291 Darmstadt, Germany

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2004年 / 525卷 / 1-2期

关键词：

gamma-ray imaging; backscatter probe;

D O I：

10.1016/j.nima.2004.03.130

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A gamma-ray imaging method is described which is suitable for non-destructive and non-invasive determination of amount and distribution of matter in objects. A point-like positron source is placed in front of the object to be examined. A position detector behind the source measuring 511 keV gamma-rays from positron annihilation determines the direction of the correlated 511 keV gamma-rays used to probe the object. Detecting the probing gamma-ray after transmission through or scattering off the object in time coincidence to the position determining gamma-ray enables to map the thickness and density distribution of the object. The method and system can be employed for security inspection of concealed items, control of erosion, deposition and structural defects, and the detection of land mines. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：328 / 331

页数：4