Aberration-Corrected Electron Microscopes at Brookhaven National Laboratory

被引：6
作者：
Zhu, Yimei [1 ]
Wall, Joe [1 ]
机构：
[1] Brookhaven Natl Lab, Long Isl City, NY 11973 USA
来源：
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 153 | 2008年 / 153卷
关键词：
D O I：
10.1016/S1076-5670(08)01012-4
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：481 / +
页数：46
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