A self-consistent method for X-ray diffraction analysis of multiaxial residual-stress fields in the near-surface region of polycrystalline materials. II. Examples

The application of the formalism for residual-stress gradient evaluation based on the measuring principle of the scattering-vector method, which has been derived in the first paper of this series [Genzel (1999). J. Appl. Cryst. 32, 770-778], is demonstrated by practical examples. Depending on the statistical scattering of the experimental data, either biaxial or even triaxial residual-stress states may be analysed; the latter case yields self-consistently the depth profiles of the in-plane stresses, sigma(11)(tau) and sigma(22)(tau), the normal stress component, sigma(33)(tau), as well as the strain-free lattice spacing, d(0)(hkl). The results obtained by this new evaluation procedure are compared with those obtained by X-ray stress-gradient analysis performed on the basis of the sin(2)psi method.