Nanoscale patterns produced by ion erosion of a solid with codeposition of impurities: The crucial effect of compound formation

被引:45
作者
Bradley, R. Mark [1 ]
机构
[1] Colorado State Univ, Dept Phys, Ft Collins, CO 80523 USA
关键词
BOMBARDMENT; SI; SURFACES; NANODOTS;
D O I
10.1103/PhysRevB.87.205408
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We advance a theory of ripple formation on the surface of an initially elemental material that is subjected to concurrent oblique-incidence impurity deposition and normal-incidence ion bombardment. The theory applies when the target atoms and impurities react to produce a chemical compound, as in many experiments that have been carried out in which the target material is silicon and the impurities are metallic. We show that the formation of a compound can destabilize a surface that would otherwise be stable. If ripples do form, they are oriented with their wave vector parallel to the projected impurity deposition direction and they propagate counter to the deposited flux. Our theory also predicts how the ripple wavelength behaves for impurity fluxes just above the threshold value necessary for ripple formation.
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页数:7
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共 42 条
[1]  
[Anonymous], 2009, FUNCTIONAL NANOMATER, DOI DOI 10.1007/978-0-387-77717-7_10
[2]  
Bradley R. M., UNPUB
[3]   Producing ripple topographies by ion bombardment with codeposition of impurities: A curvature-dependent sputter yield is not required [J].
Bradley, R. Mark .
PHYSICAL REVIEW B, 2012, 85 (11)
[4]   A surface layer of altered composition can play a key role in nanoscale pattern formation induced by ion bombardment [J].
Bradley, R. Mark ;
Shipman, Patrick D. .
APPLIED SURFACE SCIENCE, 2012, 258 (09) :4161-4170
[5]   Theory of nanodot and sputter cone arrays produced by ion sputtering with concurrent deposition of impurities [J].
Bradley, R. Mark .
PHYSICAL REVIEW B, 2011, 83 (19)
[6]   Spontaneous Pattern Formation Induced by Ion Bombardment of Binary Compounds [J].
Bradley, R. Mark ;
Shipman, Patrick D. .
PHYSICAL REVIEW LETTERS, 2010, 105 (14)
[7]   Theory of improved resolution in depth profiling with sample rotation [J].
Bradley, RM ;
Cirlin, EH .
APPLIED PHYSICS LETTERS, 1996, 68 (26) :3722-3724
[8]   Dynamic scaling of ion-sputtered rotating surfaces [J].
Bradley, RM .
PHYSICAL REVIEW E, 1996, 54 (06) :6149-6152
[9]   THEORY OF RIPPLE TOPOGRAPHY INDUCED BY ION-BOMBARDMENT [J].
BRADLEY, RM ;
HARPER, JME .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1988, 6 (04) :2390-2395
[10]   Roughening and ripple instabilities on ion-bombarded Si [J].
Carter, G ;
Vishnyakov, V .
PHYSICAL REVIEW B, 1996, 54 (24) :17647-17653