Physical properties of wedge-shaped Al thin film

被引：1

作者：

Xiang-Ming, T ^{[1
]}

Lao, YF ^{[1
]}

Ye, QL ^{[1
]}

Jin, JS ^{[1
]}

Jiao, ZK ^{[1
]}

Ye, GX ^{[1
]}

机构：

[1] Zhejiang Univ, Dept Phys, Hangzhou 310028, Peoples R China

来源：

ACTA PHYSICA SINICA | 2001年 / 50卷 / 10期

关键词：

wedge-shaped aluminum thin film;

D O I：

10.7498/aps.50.1991

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A wedge-shaped aluminum thin film system, deposited on glass surfaces by a vapor deposition method, has been fabricated. By using the expansive and movable behaviours of silicone oil drops, the Al films are quenched gradually by the silicone oil during the deposition process. An anomalous wedge-shaped structure with a slope of 10(-6)-10(-7) spontaneously forms. The I-V characteristic of the system has been studied and its rough effect cannot be interpreted as RRN model of the normal rough thin films.

引用

页码：1991 / 1995

页数：5

共 10 条

[1] MAGNETIC PHASE-TRANSITIONS IN NANOCRYSTALLINE ERBIUM [J].

COWEN, JA ;

STOLZMAN, B ;

AVERBACK, RS ;

HAHN, H .

JOURNAL OF APPLIED PHYSICS, 1987, 61 (08) :3317-3319

[2] MEASUREMENT OF THE 4TH MOMENT OF THE CURRENT DISTRIBUTION IN TWO-DIMENSIONAL RANDOM RESISTOR NETWORKS [J].

DUBSON, MA ;

HUI, YC ;

WEISSMAN, MB ;

GARLAND, JC .

PHYSICAL REVIEW B, 1989, 39 (10) :6807-6815

[3] NANOCRYSTALLINE MATERIALS [J].

GLEITER, H .

PROGRESS IN MATERIALS SCIENCE, 1989, 33 (04) :223-315

[4]

MO C, 1993, NANOSTRUCTURAL MAT, V2, P113

[5] Surface morphology and growth mechanism of the Al films deposited on liquid surfaces [J].

Tao, XM ;

Zeng, YW ;

Feng, CM ;

Jiao, ZK ;

Ye, GX .

ACTA PHYSICA SINICA, 2000, 49 (11) :2235-2239

[6] Structural and electrical properties of a metallic rough-thin-film system deposited on liquid substrates [J].

Ye, GX ;

Zhang, QR ;

Feng, CM ;

Ge, HL ;

Jiao, ZK .

PHYSICAL REVIEW B, 1996, 54 (20) :14754-14757

[7] Nucleation, growth, and aggregation of Ag clusters on liquid surfaces [J].

Ye, GX ;

Michely, T ;

Weidenhof, V ;

Friedrich, I ;

Wuttig, M .

PHYSICAL REVIEW LETTERS, 1998, 81 (03) :622-625

[8] EVIDENCE OF ANOMALOUS HOPPING AND TUNNELING EFFECTS ON THE CONDUCTIVITY OF A FRACTAL PT-FILM SYSTEM [J].

YE, GX ;

WANG, JS ;

XU, YQ ;

JIAO, ZK ;

ZHANG, QR .

PHYSICAL REVIEW B, 1994, 50 (18) :13163-13167

[9] CRITICAL BEHAVIORS IN A PT-FILM PERCOLATION SYSTEM DEPOSITED ON FRACTURE SURFACES OF ALPHA-AL2O3 CERAMICS [J].

YE, GX ;

XU, YQ ;

WANG, JS ;

JIAO, ZK ;

ZHANG, QR .

PHYSICAL REVIEW B, 1994, 49 (05) :3020-3024

[10] Structural and critical behaviors of ag rough films deposited on liquid substrates [J].

Ye, GX ;

Geng, CM ;

Zhang, ZR ;

Ge, HL ;

Zhang, XJ .

CHINESE PHYSICS LETTERS, 1996, 13 (10) :772-774

← 1 →