Atomic-scale studies of the electronic structure of ceramic/metal interfaces: {222}MgO/Cu

{222} MgO/Cu interfaces produced by internal oxidation are studied by electron energy loss spectroscopy (EELS) using an atomic sized electron beam. We determine interfacial chemistry of this interface with subnanometer spatial resolution and use EELS to measure directly the electronic states pertaining to the buried interface. The O-K edge gives evidence of metal-induced gap states (MIGS) within the bandgap of MgO, at the interface, which we find to be O terminated. Both experiment and ab initio calculations show the MIGS to be strongly localized at the interface.