Magnetoresistive Random Access Memory: The Path to Competitiveness and Scalability

被引:186
作者
Zhu, Jian-Gang [1 ]
机构
[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA
关键词
Giant magnetoresistance; magnetic random access memory (MRAM); magnetic switching; magnetic tunnel junction; magnetoresistance; nonvolatile memory; spin polarization; spin torque transfer; tunneling magnetoresistance;
D O I
10.1109/JPROC.2008.2004313
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper provides an in-depth review of the magneto resistive random access memory technology and its developments over the past decade. Both the traditional field-driven and more recent spin torque transfer driven designs are discussed. By pointing out key technical challenges, important aspects and characteristics of various designs are used to illustrate mechanisms that overcome the technical obstacles. A significant portion of this paper is devoted to the principles of various designs based on spin torque transfer effect, including memory elements with in-plane and perpendicular magnetic electrodes.
引用
收藏
页码:1786 / 1798
页数:13
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