Reliability-based measure for a system with standbys subjected to switching failures

被引:13
作者
Ke, Jyh-Bin [1 ]
Lee, Wen-Chiung [2 ]
Ke, Jau-Chuan [3 ]
机构
[1] Natl Chung Hsing Univ, Dept Appl Math, Taichung 40227, Taiwan
[2] Feng Chia Univ, Dept Stat, Taichung 40724, Taiwan
[3] Natl Taichung Inst Technol, Dept Stat, Taichung 40724, Taiwan
关键词
Failure (mechanical); Reliability management; Failure modes and effects analysis; Sensitivity analysis;
D O I
10.1108/02644400810899979
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Purpose - The purpose of this paper is to explore the reliability and sensitivity analysis of a system with M primary units, W standby units, and one repair facility when switching to primary units may fail. Design/methodology/approach - Failure times of primary and standby units are assumed to have exponential distributions, and repair times of the failed units are also assumed to have an exponential distribution. Different failure rates and switching failure probabilities are given depending on the readiness states of standby units, designated hot warm, or cold. The Laplace transform technique is used to transform a set of ordinary differential equations to a set of equations. After finding the solution, we can obtain the desired measures in the time domain by using the inverse Laplace transform. Findings - Expressions for system reliability and mean time to failure (MTTF) are derived. Sensitivity analysis of the system reliability and the MTTF with respect to system parameters are investigated. Originality/value - This paper presents the first time that a contour of the MTTF with respect to standby states has been obtained, which is quite useful for the decision makers.
引用
收藏
页码:694 / 706
页数:13
相关论文
共 11 条
[1]   RELIABILITY OF IMPERFECT SWITCHING OF COLD STANDBY SYSTEMS WITH MULTIPLE NONCRITICAL AND CRITICAL ERRORS [J].
CHUNG, WK .
MICROELECTRONICS AND RELIABILITY, 1995, 35 (12) :1479-1482
[2]  
Coit DW, 2003, IIE TRANS, V35, P535, DOI [10.1080/07408170304420, 10.1090/07408170390183062]
[3]   Cold-standby redundancy optimization for nonrepairable systems [J].
Coit, DW .
IIE TRANSACTIONS, 2001, 33 (06) :471-478
[4]   Cold standby systems with imperfect and noninstantaneous switch-over mechanism [J].
Gurov, SV ;
Utkin, LV .
MICROELECTRONICS AND RELIABILITY, 1996, 36 (10) :1425-1438
[5]   ON COMPARISON OF MTBF BETWEEN 4 REDUNDANT-SYSTEMS [J].
MENG, FC .
MICROELECTRONICS AND RELIABILITY, 1993, 33 (13) :1987-1990
[6]   Reliability prediction of imperfect switching systems subject to multiple stresses [J].
Pan, JN .
MICROELECTRONICS AND RELIABILITY, 1997, 37 (03) :439-445
[7]   PROBABILISTIC ANALYSIS OF A 2-UNIT SYSTEM WITH A WARM STANDBY AND A SINGLE REPAIR FACILITY [J].
SRINIVASAN, SK ;
GOPALAN, MN .
OPERATIONS RESEARCH, 1973, 21 (03) :748-754
[8]   RELIABILITY OF A REPAIRABLE SYSTEM WITH STANDBY FAILURE [J].
SUBRAMANIAN, R ;
VENKATAKRISHNAN, KS ;
KISTNER, KP .
OPERATIONS RESEARCH, 1976, 24 (01) :169-176
[9]   RELIABILITY OF A SYSTEM WITH WARM STANDBYS AND REPAIRMEN [J].
WANG, KH ;
SIVAZLIAN, BD .
MICROELECTRONICS AND RELIABILITY, 1989, 29 (05) :849-860
[10]   Cost and probabilistic analysis of series systems with mixed standby components [J].
Wang, KH ;
Kuo, CC .
APPLIED MATHEMATICAL MODELLING, 2000, 24 (12) :957-967