Electro-thermal simulation with the SISSI package

被引：2

作者：

Székely, V ^{[1
]}

Páhi, A ^{[1
]}

Poppe, A ^{[1
]}

Rencz, M ^{[1
]}

机构：

[1] Tech Univ Budapest, Dept Electron Devices, H-1521 Budapest, Hungary

来源：

ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING | 1999年 / 21卷 / 01期

基金：

匈牙利科学研究基金会;

关键词：

electro-thermal simulation; simultaneous iteration; compact thermal modeling;

D O I：

10.1023/A:1008371625945

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper a brief overview of the electro-thermal simulation based on the method of simultaneous iteration is given, through the example of the SISSI (Simulator for Integrated Structures by Simultaneous Iteration) package. The modular approach used for the layout-based electro-thermal netlist generation is described. This approach allows an easy implementation of package model libraries. The capabilities of SISSI are introduced by simulation examples where in most cases the results are compared to measurement results.

引用

页码：21 / 31

页数：11

共 50 条

[1] Electro-Thermal Simulation with the SISSI Package
V. Sze´kely
A. Pa´hi
A. Poppe
M. Rencz
Analog Integrated Circuits and Signal Processing, 1999, 21 : 21 - 31
[2] Electro-thermal transistor models in the SISSI electro-thermal IC simulator
Székely, V
Poppe, A
Hajas, G
THERMAL AND MECHANICAL SIMULATION AND EXPERIMENTS IN MICROELECTRONICS AND MICROSYSTEMS, 2004, : 105 - 112
[3] Electro-thermal simulation for the prediction of chip operation within the package
Rencz, M
Székely, V
Poppe, A
Torki, K
Courtois, B
NINETEENTH ANNUAL IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM, 2003, : 168 - 175
[4] Model Order Reduction of an Electro-Thermal Package Model
Banagaaya, N.
Feng, L.
Meuris, P.
Schoenmaker, W.
Benner, P.
IFAC PAPERSONLINE, 2015, 48 (01): : 934 - +
[5] COUPLED ELECTRO-THERMAL SIMULATION OF MOSFETs
Ni, Chunjian
Aksamija, Zlatan
Murthy, Jayathi Y.
Ravaioli, Umberto
IPACK 2009: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2009, VOL 1, 2010, : 161 - 173
[6] Coupled electro-thermal simulation of MOSFETs
Ni, Chunjian
Aksamija, Zlatan
Murthy, Jayathi Y.
Ravaioli, Umberto
JOURNAL OF COMPUTATIONAL ELECTRONICS, 2012, 11 (01) : 93 - 105
[7] Electro-thermal simulation of MEMS elements
Rencz, M
Székely, V
Poppe, A
Courtois, B
DTIP 2003: DESIGN, TEST, INTEGRATION AND PACKAGING OF MEMS/MOEMS 2003, 2003, : 15 - 20
[8] Coupled electro-thermal simulation of MOSFETs
Chunjian Ni
Zlatan Aksamija
Jayathi Y. Murthy
Umberto Ravaioli
Journal of Computational Electronics, 2012, 11 : 93 - 105
[9] A critical review of thermal models for electro-thermal simulation
d'Alessandro, V
Rinaldi, N
SOLID-STATE ELECTRONICS, 2002, 46 (04) : 487 - 496
[10] Numerical Simulation of Electro-thermal Deicing Process
Chang Shinan
Tu Min
Ai Suxiao
PROGRESS IN SAFETY SCIENCE AND TECHNOLOGY, VOL VII, PTS A AND B, 2008, 7 : 2033 - 2038

← 1 2 3 4 5 →