Study on phenyltrimethoxysilane treated nano-silica filled high performance poly(etheretherketone) nanocomposites

被引:33
作者
Goyal, R. K. [1 ]
Kapadia, A. S. [1 ]
机构
[1] Coll Engn, Dept Met & Mat Sci, Pune 411005, Maharashtra, India
关键词
Polymer-matrix composites (PMCs); Thermal properties; Electrical properties; Electron microscopy; PEEK; DIELECTRIC-PROPERTIES; CRYSTALLIZATION KINETICS; NUCLEATION ACTIVITY; THERMAL-EXPANSION; SIO2; CONDUCTIVITY; BEHAVIOR; FILMS;
D O I
10.1016/j.compositesb.2013.01.015
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Phenyltrimethoxysilane treated silica (SiO2) nanoparticles filled high performance poly(etheretherketone) matrix nanocomposites were prepared using hot pressing. The experimental density of the nanocomposites containing 3 vol.% SiO2 was very close to the theoretical density, while thereafter it decreased compared to theoretical density. Scanning electron microscopy showed uniform dispersion of SiO2 in the matrix. The addition of treated SiO2 did not change the crystal structure of the matrix. The coefficient of thermal expansion (CTE) of the nanocomposites decreased approximately 25% at 20 vol.% SiO2 content. The values of CTE of the nanocomposites were lower than the values predicted from the rule of mixtures indicating good adhesion between the SiO2 and the matrix. The presence of SiO2 in the matrix did not affect significantly the melting point and the glass transition temperature of the matrix. The nanocomposites showed thermal stability better than 560 degrees C. The dielectric constant and dissipation factor were reduced slightly for the nanocomposites compared to those of pure PEEK and untreated nanocomposites. The improvement in dimensional stability, dielectric properties and the better thermal stability of the nanocomposites make them promising candidates for the printed circuit boards or electronic substrates. (C) 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:135 / 143
页数:9
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