Crystal-field excitations in NiO studied with hard x-ray resonant inelastic x-ray scattering at the NiK edge

被引：40

作者：

Huotari, Simo ^{[1
]}

Pylkkaenen, Tuomas ^{[1
,2
]}

Vanko, Gyoergy ^{[1
,3
]}

Verbeni, Roberto ^{[1
]}

Glatzel, Pieter ^{[1
]}

Monaco, Giulio ^{[1
]}

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble 9, France

[2] Univ Helsinki, Dept Phys, Div Mat Phys, FIN-00014 Helsinki, Finland

[3] KFKI Res Inst Particle & Nucl Phys, H-1525 Budapest, Hungary

来源：

PHYSICAL REVIEW B | 2008年 / 78卷 / 04期

关键词：

D O I：

10.1103/PhysRevB.78.041102

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Charge-neutral dd excitations in NiO have been studied using resonant inelastic x-ray scattering (RIXS) at the quadrupolar pre-edge of the Ni K absorption edge (8331 eV) with an energy resolution of 250 meV. The results agree well with calculations performed using the atomic multiplet model for the Ni2+ ion including crystal-field effects. Most notably the first t(2g)-> e(g) excitation at 1.05 eV was observed clearly and its energy determined with a high accuracy. The remaining differences between the theoretical and the experimental results, especially in the incident-photon-energy dependence, are suggested to be due to lattice distortions. This study demonstrates that bulk sensitive, high-resolution hard-x-ray RIXS can open up possibilities in studies of highly correlated materials.

引用

页数：4

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