In-process Monitoring of Tool Behavior and Tool Wear in End Milling by Use of Projection Image

被引:3
作者
Yoshimitsu, Shinichi [1 ]
Satonaka, Shinobu [2 ]
Kawano, Yoshihiro [1 ]
Iwamoto, Chihiro [2 ]
Zuo, Dunwen [3 ]
Yamashita, Shunichi [1 ]
机构
[1] 1460-1 Hayatocho Shinkou, Kagoshima 8995193, Japan
[2] 2-39-1, Kurokami, Kumamoto 8608555, Japan
[3] 29 Yudao St, Nanjing 210016, Peoples R China
来源
EMERGING TECHNOLOGY IN PRECISION ENGINEERING XIV | 2012年 / 523-524卷
关键词
monitoring; tool deflection; tool wear; tool behavior; projection image;
D O I
10.4028/www.scientific.net/KEM.523-524.433
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This report describes a two-dimensional monitoring system for milling machines using small-diameter tools. Small-diameter tools are used for high-speed milling, and they are indispensable for high-quality and high-productivity manufacturing. However, tool breakage occasionally occurs, and this becomes a serious problem in automated production. This study aims to develop a system for monitoring the cutting state that can prevent tool breakage. The proposed system consists of two charge-coupled device (CCD) cameras, an image processing device, a man-machine controller (MMC), and a machining center with an open computer numeric (CNC). This monitoring system is connected to the machining center by Ethernet. It enables the precise measurement of tool deflection during high-speed milling. In an experiment, we applied this system to the end milling of a steel plate under different cutting conditions, and we examined the relationship between tool deflection and the cutting conditions. In addition, we applied this monitoring system to measure tool wear, and we examined the relationship between tool deflection and tool wear. It was found that the proposed system enabled in-process monitoring of the cutting state and tool wear.
引用
收藏
页码:433 / +
页数:2
相关论文
共 4 条
[1]  
Daikoh Y., 1994, J JSPE, V60, P1796
[2]  
Kawano Y, 2005, J JSPE, P363
[3]  
MIYAGUCHI T, 2001, J JAPAN SOC PRECISIO, V67, P450
[4]  
Yoshimitsu S, 2009, ASPEN2009