High numerical aperture reflection mode coherent diffraction microscopy using off-axis apertured illumination

被引：68

作者：

Gardner, Dennis F. ^{[1
]}

Zhang, Bosheng ^{[1
]}

Seaberg, Matthew D. ^{[1
]}

Martin, Leigh S. ^{[1
]}

Adams, Daniel E. ^{[1
]}

Salmassi, Farhad ^{[2
]}

Gullikson, Eric ^{[2
]}

Kapteyn, Henry ^{[1
]}

Murnane, Margaret ^{[1
]}

机构：

[1] Univ Colorado, JILA, Boulder, CO 80309 USA

[2] Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA

来源：

OPTICS EXPRESS | 2012年 / 20卷 / 17期

基金：

美国国家科学基金会;

关键词：

X-RAY CRYSTALLOGRAPHY; PHASE RETRIEVAL; RESOLUTION; PROJECTIONS; GENERATION; NANOSCALE; HARMONICS; GEOMETRY; ALLOW; CELLS;

D O I：

10.1364/OE.20.019050

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We extend coherent diffraction imaging (CDI) to a high numerical aperture reflection mode geometry for the first time. We derive a coordinate transform that allows us to rewrite the recorded far-field scatter pattern from a tilted object as a uniformly spaced Fourier transform. Using this approach, FFTs in standard iterative phase retrieval algorithms can be used to significantly speed up the image reconstruction times. Moreover, we avoid the isolated sample requirement by imaging a pinhole onto the specimen, in a technique termed apertured illumination CDI. By combining the new coordinate transformation with apertured illumination CDI, we demonstrate rapid high numerical aperture imaging of samples illuminated by visible laser light. Finally, we demonstrate future promise for this technique by using high harmonic beams for high numerical aperture reflection mode imaging. (C) 2012 Optical Society of America

引用

页码：19050 / 19059

页数：10

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