Doubling the far-field resolution in mid-infrared microscopy

被引:7
作者
Kumbham, Mahendar [1 ,2 ]
Daly, Susan [1 ,2 ]
O'Dwyer, Kevin [1 ,2 ]
Mouras, Rabah [1 ,2 ]
Liu, Ning [1 ,2 ]
Mani, Aladin [1 ,2 ]
Peremans, Andre [3 ]
Tofail, Syed M. [1 ,2 ]
Silien, Christophe [1 ,2 ]
机构
[1] Univ Limerick, Dept Phys, Limerick, Ireland
[2] Univ Limerick, Bernal Inst, Limerick, Ireland
[3] LaserSpec SPRL, Malonne, Belgium
来源
OPTICS EXPRESS | 2016年 / 24卷 / 21期
基金
爱尔兰科学基金会;
关键词
SOLID IMMERSION LENS; SUBSURFACE MICROSCOPY; SUPERRESOLUTION; RECONSTRUCTION; DIFFRACTION; DENSITY; MICROSPECTROSCOPY; SPECTROSCOPY; LIGHT; FOCUS;
D O I
10.1364/OE.24.024377
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The spatial resolution in far-field mid-infrared (lambda > 2.5 mu m) microscopy and micro-spectroscopy remains limited with the full-width at half maximum of the point-spread function ca. lambda/1.3; a value that is very poor in comparison to that commonly accessible with visible and near-infrared optics. Hereafter, it is demonstrated however that polymer beads that are centre-to-centre spaced by lambda/2.6 can be resolved in the mid-infrared. The more than 2-fold improvement in resolution in the far-field is achieved by exploiting a newly constructed scanning microscope built around a mid-infrared optical parametric oscillator and a central solid-immersion lens, and by enforcing the linear polarization unidirectional resolution enhancement with a novel and robust specimen error minimization based on a particle swarm optimization. The method is demonstrated with specimens immersed in air and in water, and its robustness shown by the analysis of dense and complex self-assembled bead islands. (C) 2016 Optical Society of America
引用
收藏
页码:24377 / 24389
页数:13
相关论文
共 41 条
[1]   Crossing the Resolution Limit in Near-Infrared Imaging of Silicon Chips: Targeting 10-nm Node Technology [J].
Agarwal, Krishna ;
Chen, Rui ;
Koh, Lian Ser ;
Sheppard, Colin J. R. ;
Chen, Xudong .
PHYSICAL REVIEW X, 2015, 5 (02)
[2]   Aberrations and allowances for errors in a hemisphere solid immersion lens for submicron-resolution photoluminescence microscopy [J].
Baba, M ;
Sasaki, T ;
Yoshita, M ;
Akiyama, H .
JOURNAL OF APPLIED PHYSICS, 1999, 85 (09) :6923-6925
[3]   Using Fourier transform IR spectroscopy to analyze biological materials [J].
Baker, Matthew J. ;
Trevisan, Julio ;
Bassan, Paul ;
Bhargava, Rohit ;
Butler, Holly J. ;
Dorling, Konrad M. ;
Fielden, Peter R. ;
Fogarty, Simon W. ;
Fullwood, Nigel J. ;
Heys, Kelly A. ;
Hughes, Caryn ;
Lasch, Peter ;
Martin-Hirsch, Pierre L. ;
Obinaju, Blessing ;
Sockalingum, Ganesh D. ;
Sule-Suso, Josep ;
Strong, Rebecca J. ;
Walsh, Michael J. ;
Wood, Bayden R. ;
Gardner, Peter ;
Martin, Francis L. .
NATURE PROTOCOLS, 2014, 9 (08) :1771-1791
[4]  
Birge B., 2003, SIS, P973
[5]   Resolution limits for infrared microspectroscopy explored with synchrotron radiation [J].
Carr, GL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (03) :1613-1619
[6]   Correcting the Effect of Refraction and Dispersion of Light in FT-IR Spectroscopic Imaging in Transmission through Thick Infrared Windows [J].
Chan, K. L. Andrew ;
Kazarian, Sergei G. .
ANALYTICAL CHEMISTRY, 2013, 85 (02) :1029-1036
[7]   Imaging using cylindrical vector beams in a high-numerical-aperture microscopy system [J].
Chen, Rui ;
Agarwal, Krishna ;
Sheppard, Colin J. R. ;
Chen, Xudong .
OPTICS LETTERS, 2013, 38 (16) :3111-3114
[8]   A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscope [J].
Chen, Rui ;
Agarwal, Krishna ;
Sheppard, Colin J. R. ;
Phang, Jacob C. H. ;
Chen, Xudong .
OPTICS EXPRESS, 2013, 21 (12) :14316-14330
[9]   Complete modeling of subsurface microscopy system based on aplanatic solid immersion lens [J].
Chen, Rui ;
Agarwal, Krishna ;
Zhong, Yu ;
Sheppard, Colin J. R. ;
Phang, Jacob C. H. ;
Chen, Xudong .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2012, 29 (11) :2350-2359
[10]   Dictionary-based image reconstruction for superresolution in integrated circuit imaging [J].
Cilingiroglu, T. Berkin ;
Uyar, Aydan ;
Tuysuzoglu, Ahmet ;
Karl, W. Clem ;
Konrad, Janusz ;
Goldberg, Bennett B. ;
Uenlue, M. Selim .
OPTICS EXPRESS, 2015, 23 (11) :15072-15087