A compound control chart for monitoring and controlling high quality processes

被引:31
|
作者
Bersimis, Sotiris [1 ]
Koutras, Markos V. [1 ]
Maravelakis, Petros E. [2 ]
机构
[1] Univ Piraeus, Dept Stat & Insurance Sci, Piraeus 18534, Greece
[2] Univ Piraeus, Dept Business Adm, Piraeus 18534, Greece
关键词
Quality control; Applied probability; High quality processes; Run length distribution; Markov chain impedance; Conforming run length; PROCESS STANDARD-DEVIATION; LENGTH CONTROL CHARTS; HIGH-YIELD PROCESSES; CUSUM CHARTS; ATTRIBUTES; EWMA; RUN; INSPECTION; CCC;
D O I
10.1016/j.ejor.2013.08.017
中图分类号
C93 [管理学];
学科分类号
12 ; 1201 ; 1202 ; 120202 ;
摘要
In the present article, we propose a new control chart for monitoring high quality processes. More specifically, we suggest declaring the monitored process out of control, by exploiting a compound rule couching on the number of conforming units observed between the (i-1)th and the ith nonconforming item and the number of conforming items observed between the (i-2)th and the ith nonconforming item. Our numerical experimentation demonstrates that the proposed control chart, in most of the cases, exhibits a better (or at least equivalent) performance than its competitors. (C) 2013 Elsevier B.V. All rights reserved.
引用
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页码:595 / 603
页数:9
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