A compound control chart for monitoring and controlling high quality processes

被引：31

作者：

Bersimis, Sotiris ^{[1
]}

Koutras, Markos V. ^{[1
]}

Maravelakis, Petros E. ^{[2
]}

机构：

[1] Univ Piraeus, Dept Stat & Insurance Sci, Piraeus 18534, Greece

[2] Univ Piraeus, Dept Business Adm, Piraeus 18534, Greece

来源：

EUROPEAN JOURNAL OF OPERATIONAL RESEARCH | 2014年 / 233卷 / 03期

关键词：

Quality control; Applied probability; High quality processes; Run length distribution; Markov chain impedance; Conforming run length; PROCESS STANDARD-DEVIATION; LENGTH CONTROL CHARTS; HIGH-YIELD PROCESSES; CUSUM CHARTS; ATTRIBUTES; EWMA; RUN; INSPECTION; CCC;

D O I：

10.1016/j.ejor.2013.08.017

中图分类号：

C93 [管理学];

学科分类号：

12 ; 1201 ; 1202 ; 120202 ;

摘要：

In the present article, we propose a new control chart for monitoring high quality processes. More specifically, we suggest declaring the monitored process out of control, by exploiting a compound rule couching on the number of conforming units observed between the (i-1)th and the ith nonconforming item and the number of conforming items observed between the (i-2)th and the ith nonconforming item. Our numerical experimentation demonstrates that the proposed control chart, in most of the cases, exhibits a better (or at least equivalent) performance than its competitors. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：595 / 603

页数：9

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