Quality control;
Applied probability;
High quality processes;
Run length distribution;
Markov chain impedance;
Conforming run length;
PROCESS STANDARD-DEVIATION;
LENGTH CONTROL CHARTS;
HIGH-YIELD PROCESSES;
CUSUM CHARTS;
ATTRIBUTES;
EWMA;
RUN;
INSPECTION;
CCC;
D O I:
10.1016/j.ejor.2013.08.017
中图分类号:
C93 [管理学];
学科分类号:
12 ;
1201 ;
1202 ;
120202 ;
摘要:
In the present article, we propose a new control chart for monitoring high quality processes. More specifically, we suggest declaring the monitored process out of control, by exploiting a compound rule couching on the number of conforming units observed between the (i-1)th and the ith nonconforming item and the number of conforming items observed between the (i-2)th and the ith nonconforming item. Our numerical experimentation demonstrates that the proposed control chart, in most of the cases, exhibits a better (or at least equivalent) performance than its competitors. (C) 2013 Elsevier B.V. All rights reserved.
机构:
Citicorp Credit Serv, Long Isl City, NY 11101 USACiticorp Credit Serv, Long Isl City, NY 11101 USA
Huang, Wandi
Reynolds, Marion R., Jr.
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机构:
Virginia Tech, Dept Stat, Blacksburg, VA 24061 USA
Virginia Tech, Dept Forest Resources & Environm Conservat, Blacksburg, VA 24061 USACiticorp Credit Serv, Long Isl City, NY 11101 USA
Reynolds, Marion R., Jr.
Wang, Sai
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机构:
Capital One Financial Corp, Mclean, VA 22102 USACiticorp Credit Serv, Long Isl City, NY 11101 USA