Study of AlGaN-based deep ultraviolet laser diodes using one-way step-shaped quantum barriers and symmetrical step-shaped electron and hole blocking layers

被引:3
|
作者
Zhang, Aoxiang [1 ]
Ren, Bingyang [2 ]
Wang, Fang [1 ,3 ,4 ,5 ]
Liou, Juin J. [1 ,3 ,5 ]
Liu, Yuhuai [1 ,3 ,4 ,5 ]
机构
[1] Zhengzhou Univ, Natl Ctr Int Joint Res Elect Mat & Syst, Sch Informat Engn, Int Joint Lab Elect Mat & Syst Henan Prov, Zhengzhou, Peoples R China
[2] Zhengzhou Univ, Sch Comp & Artificial Intelligence, Zhengzhou, Peoples R China
[3] Zhengzhou Univ, Inst Intelligent Sensing, Zhengzhou, Peoples R China
[4] Zhengzhou Way Do Elect Co Ltd, Zhengzhou, Peoples R China
[5] Zhengzhou Univ, Res Inst Ind Technol Co Ltd, Zhengzhou, Peoples R China
基金
中国国家自然科学基金;
关键词
AlGaN-based deep ultraviolet laser diodes; carrier injection efficiency; one-way step-shaped quantum barriers; blocking layers; LIGHT-EMITTING-DIODES; PERFORMANCE; INJECTION;
D O I
10.1117/1.OE.61.10.106101
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
To improve the carrier injection efficiency and optimize the performance of the AlGaN-based deep ultraviolet laser diodes (DUV-LDs), one-way step-shaped quantum barriers (OWS-QBs), a symmetrical step-shaped electron blocking layer (SS-EBL), and a symmetrical step-shaped hole blocking layer (SS-HBL) are proposed. Crosslight software is used to simulate the DUV-LDs with a traditional structure, with OWS-QBs, and with OWS-QBs, a SS-EBL, and a SS-HBL. The simulation results and physical mechanism analysis indicate that the SS-EBL, SS-HBL, and OWS-QBs contribute to the increased carrier concentration in the quantum wells, the reduced carrier leakage in the nonactive regions, the increased stimulated emission rate, the reduced threshold current and threshold voltage, and the enhanced output power and electro-optical conversion efficiency of DUV-LDs. (C) 2022 Society of Photo-Optical Instrumentation Engineers (SPIE)
引用
收藏
页数:12
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