As-modified Si(100) Surfaces for III-V-on-Si Tandem Solar Cells

被引:0
作者
Paszuk, Agnieszka [1 ]
Supplie, Oliver [1 ]
Nandy, Manali [1 ]
Brueckner, Sebastian [1 ]
Dobrich, Anja [1 ]
Kleinschmidt, Peter [1 ]
Kim, Boram [2 ]
Nakano, Yoshiaki [2 ]
Sugiyama, Masakazu [2 ]
Hannappel, Thomas [1 ]
机构
[1] Ilmenau Univ Technol, Inst Phys, Photovolta Grp, D-98693 Ilmenau, Germany
[2] Univ Tokyo, Res Ctr Adv Sci & Technol, Bunkyo Ku, Tokyo 1538904, Japan
来源
2018 IEEE 7TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION (WCPEC) (A JOINT CONFERENCE OF 45TH IEEE PVSC, 28TH PVSEC & 34TH EU PVSEC) | 2018年
关键词
MOCVD; optical in situ spectroscopy; silicon; surface; tandem absorber; IN-SITU;
D O I
暂无
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
In order to avoid formation of antiphase domains at the III-V/Si interface, which significantly can reduce the performance of photovoltaic devices, the Si(100) surface requires precise, double-atomic-step preparation. Here, we study the interaction of Si(100) surfaces with As, which is present in most application-relevant III-V MOCVD reactors, in dependence of the miscut magnitude. Combining optical in situ spectroscopy with ultra-high-vacuum-based surface analysis, we yield control over the dimer orientation on the Si: As surfaces. We demonstrate both (1x2) and (2x1) reconstructed surfaces, and atomically smooth Si(100): As 0.1 degrees surfaces with evenly spaced, double-atomic steps, which are highly suitable for subsequent III-V integration.
引用
收藏
页码:0233 / 0236
页数:4
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