Design and Implementation of Active Decoupling Capacitor Circuits for Power Supply Regulation in Digital ICs

被引:27
作者
Gu, Jie [1 ]
Harjani, Ramesh [1 ]
Kim, Chris H. [1 ]
机构
[1] Univ Minnesota, Dept Elect & Comp Engn, Minneapolis, MN 55455 USA
关键词
Circuit modeling; integrated circuit (IC) design; power supply noise; NOISE; VERIFICATION; REDUCTION;
D O I
10.1109/TVLSI.2008.2004543
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Control of on-chip power supply noise has become a major challenge for continuous scaling of CMOS technology. Conventional passive decoupling capacitors (decaps) exhibit significant area and leakage penalties. To improve the efficiency of power supply regulation, this paper proposes a distributed active decap circuit for use in digital integrated circuits (ICs). The proposed design uses an operational amplifier to boost the performance of conventional decaps. Simulations proved its enhanced decoupling effect in comparison with passive decaps. The proposed active decap also shows advantages in providing additional damping to the on-chip resonant noise. To verify the performance from the proposed circuit, a 0.18-mu m test chip with on-chip noise generators and sensors has been fabricated. Measurements show a 4-11 x boost in decap value over conventional passive decaps for frequencies up to 1 GHz with a total area saving of 40%. Local supply noise distribution and decap gating capability were also examined from the test chip.
引用
收藏
页码:292 / 301
页数:10
相关论文
共 20 条
[1]   A study of soft and hard breakdown - Part II: Principles of area, thickness, and voltage scaling [J].
Alam, MA ;
Weir, BE ;
Silverman, PJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (02) :239-246
[2]  
Ang M., 2000, IEEE Intl. Solid-State Circuits Conference ISSCC, P438
[3]   Methodology and experimental verification for substrate noise reduction in CMOS mixed-signal ICs with synchronous digital circuits [J].
Badaroglu, M ;
van Heijningen, M ;
Gravot, V ;
Compiet, J ;
Donnay, S ;
Gielen, GGE ;
De Man, HJ .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2002, 37 (11) :1383-1395
[4]   On-chip decoupling capacitor optimization for noise and leakage reduction [J].
Chen, HH ;
Neely, JS ;
Wang, MF ;
Co, G .
16TH SYMPOSIUM ON INTEGRATED CIRCUITS AND SYSTEMS DESIGN, SBCCI 2003, PROCEEDINGS, 2003, :251-255
[5]  
Cheng JS, 1998, BIOM HLTH R, V21, P3
[6]  
Gowan MK, 1998, 1998 DESIGN AUTOMATION CONFERENCE, PROCEEDINGS, P726, DOI 10.1109/DAC.1998.724567
[7]  
Hailu E., 2006, 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers, P2238, DOI [10.1109/ISSCC.2006.1696285, DOI 10.1109/ISSCC.2006.1696285]
[8]   Noise margin and leakage in ultra-low leakage SRAM cell design [J].
Hook, TB ;
Breitwisch, M ;
Brown, J ;
Cottrell, P ;
Hoyniak, D ;
Lam, C ;
Mann, R .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (08) :1499-1501
[9]  
MAK TM, 2003, CRC IEEE BAST WORKSH
[10]   Scaling trends of on-chip power distribution noise [J].
Mezhiba, AV ;
Friedman, EG .
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2004, 12 (04) :386-394