X-ray phase microscopy using the speckle tracking technique

被引：20

作者：

Berujon, Sebastien ^{[1
,2
]}

Wang, Hongchang ^{[1
]}

Pape, Ian ^{[1
]}

Sawhney, Kawal ^{[1
]}

机构：

[1] Diamond Light Source, Didcot OX11 0DE, Oxon, England

[2] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

APPLIED PHYSICS LETTERS | 2013年 / 102卷 / 15期

关键词：

GRATING INTERFEROMETER; CONTRAST; TOMOGRAPHY;

D O I：

10.1063/1.4802729

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Hard X-ray phase microscopy using the Speckle Tracking technique is presented and the practical implementation of this microscope explained. It is demonstrated that the spatial resolution of the Speckle Tracking technique can be pushed down to the nanometer scale without sacrificing the angular sensitivity, which is in the tens of nanoradians range. Moreover, the method is suitable for the analysis of dynamic samples. Experimental demonstration of the method is given for the case of phase imaging of micrometer size polystyrene spheres using a Fresnel zone plate as a magnifying optical element. (C) 2013 AIP Publishing LLC [http://dx.doi.org/10.1063/1.4802729]

引用

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