Optical critical points of thin-film Ge1-ySny alloys:: A comparative Ge1-ySny/Ge1-xSix study

被引:329
作者
D'Costa, VR [1 ]
Cook, CS
Birdwell, AG
Littler, CL
Canonico, M
Zollner, S
Kouvetakis, J
Menéndez, J
机构
[1] Arizona State Univ, Dept Phys & Astron, Tempe, AZ 85287 USA
[2] Arizona State Univ, Dept Chem & Biochem, Tempe, AZ 85287 USA
[3] Natl Inst Stand & Technol, Div Semicond Elect, Gaithersburg, MD 20899 USA
[4] Univ N Texas, Dept Phys, Denton, TX 76203 USA
[5] Freescale Semicond Phys Anal Lab Arizona, PALAZ, Tempe, AZ 85284 USA
[6] APRDL, Austin, TX 78721 USA
来源
PHYSICAL REVIEW B | 2006年 / 73卷 / 12期
关键词
D O I
10.1103/PhysRevB.73.125207
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The E-0, E-0+Delta(0), E-1, E-1+Delta(1), E-0('), and E-2 optical transitions have been measured in Ge1-ySny alloys (y < 0.2) using spectroscopic ellipsometry and photoreflectance. The results indicate a strong nonlinearity (bowing) in the compositional dependence of these quantities. Such behavior is not predicted by electronic structure calculations within the virtual crystal approximation. The bowing parameters for Ge1-ySny alloys show an intriguing correlation with the corresponding bowing parameters in the Ge1-xSix system, suggesting a scaling behavior for the electronic properties that is the analog of the scaling behavior found earlier for the vibrational properties. A direct consequence of this scaling behavior is a significant reduction (relative to prior theoretical estimates within the virtual crystal approximation) of the concentration y(c) for a crossover from an indirect- to a direct-gap system.
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页数:16
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共 96 条
[1]   Optical and structural properties of SixSnyGe1-x-y alloys [J].
Aella, P ;
Cook, C ;
Tolle, J ;
Zollner, S ;
Chizmeshya, AVG ;
Kouvetakis, J .
APPLIED PHYSICS LETTERS, 2004, 84 (06) :888-890
[2]   BOND-LENGTH RELAXATION IN SI1-XGEX ALLOYS [J].
ALDRICH, DB ;
NEMANICH, RJ ;
SAYERS, DE .
PHYSICAL REVIEW B, 1994, 50 (20) :15026-15033
[3]   EPITAXIAL-GROWTH OF METASTABLE SNGE ALLOYS [J].
ASOM, MT ;
FITZGERALD, EA ;
KORTAN, AR ;
SPEAR, B ;
KIMERLING, LC .
APPLIED PHYSICS LETTERS, 1989, 55 (06) :578-579
[4]   SCHOTTKY-BARRIER ELECTROREFLECTANCE OF GE - NONDEGENERATE AND ORBITALLY DEGENERATE CRITICAL-POINTS [J].
ASPNES, DE .
PHYSICAL REVIEW B, 1975, 12 (06) :2297-2310
[5]   THIRD-DERIVATIVE MODULATION SPECTROSCOPY WITH LOW-FIELD ELECTROREFLECTANCE [J].
ASPNES, DE .
SURFACE SCIENCE, 1973, 37 (01) :418-442
[6]   DIRECT OBSERVATION OF E0 AND E0 + DELTA0 TRANSITIONS IN SILICON [J].
ASPNES, DE ;
STUDNA, AA .
SOLID STATE COMMUNICATIONS, 1972, 11 (10) :1375-&
[7]   Evolution of optical constants and electronic structure of disordered Si1-xGex alloys [J].
Bahng, JH ;
Kim, KJ ;
Ihm, SH ;
Kim, JY ;
Park, HL .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2001, 13 (04) :777-786
[8]   Synthesis of ternary SiGeSn semiconductors on Si(100) via SnxGe1-x buffer layers [J].
Bauer, M ;
Ritter, C ;
Crozier, PA ;
Ren, J ;
Menendez, J ;
Wolf, G ;
Kouvetakis, J .
APPLIED PHYSICS LETTERS, 2003, 83 (11) :2163-2165
[9]   Ge-Sn semiconductors for band-gap and lattice engineering [J].
Bauer, M ;
Taraci, J ;
Tolle, J ;
Chizmeshya, AVG ;
Zollner, S ;
Smith, DJ ;
Menendez, J ;
Hu, CW ;
Kouvetakis, J .
APPLIED PHYSICS LETTERS, 2002, 81 (16) :2992-2994
[10]   SnGe superstructure materials for Si-based infrared optoelectronics [J].
Bauer, MR ;
Cook, CS ;
Aella, P ;
Tolle, J ;
Kouvetakis, J ;
Crozier, PA ;
Chizmeshya, AVG ;
Smith, DJ ;
Zollner, S .
APPLIED PHYSICS LETTERS, 2003, 83 (17) :3489-3491