Following the deformation behavior of nanocrystalline Pd films on polyimide substrates using in situ synchrotron XRD

被引：14

作者：

Lohmiller, J. ^{[1
]}

Baumbusch, R. ^{[1
]}

Kerber, M. B. ^{[2
,3
]}

Castrup, A. ^{[2
]}

Hahn, H. ^{[2
]}

Schafler, E. ^{[3
]}

Zehetbauer, M. ^{[3
]}

Kraft, O. ^{[1
]}

Gruber, P. A. ^{[1
]}

机构：

[1] Karlsruhe Inst Technol, Inst Appl Mat, D-76021 Karlsruhe, Germany

[2] Karlsruhe Inst Technol, Inst Nanotechnol, D-76021 Karlsruhe, Germany

[3] Univ Vienna, Fac Phys, A-1010 Vienna, Austria

来源：

MECHANICS OF MATERIALS | 2013年 / 67卷

基金：

奥地利科学基金会;

关键词：

Nanocrystalline materials; Synchrotron; Plasticity; Deformation mechanisms; Thin films; XRD; PLASTIC-DEFORMATION; DISLOCATION MODEL; STRAIN ANISOTROPY; PALLADIUM FILMS; STRENGTH; CRYSTALS; METALS; GRAINS;

D O I：

10.1016/j.mechmat.2013.04.010

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The deformation behavior of nanocrystalline Pd films on compliant polyimide substrates is investigated using a synchrotron-based in situ tensile testing technique. The combination of analytical and physical modeling of the evolution of peak shape during deformation allows to subdivide the deformation behavior into elastic, microplastic and macroplastic deformation. The results confirm that the deformation behavior of nanocrystalline Pd in the grain size regime of 50 nm is still governed by dislocation plasticity, however, in addition, thermally activated grain boundary mediated deformation mechanisms are active. The deformation behavior of the nanocrystalline Pd films is thus given by a specific sequence of a highly heterogeneous elastic response of the nanocrystalline aggregate, its accommodation by grain boundary mediated deformation and upcoming dislocation activity within individual grains. (C) 2013 Elsevier Ltd. All rights reserved.

引用

页码：65 / 73

页数：9

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