共 50 条
[1]
Circuit failure prediction and its application to transistor aging
[J].
25TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS,
2007,
:277-+
[2]
ALIDINA M, 1994, IEEE IC CAD, P74
[3]
On the minimization of potential transient errors and SER in logic circuits using SPFD
[J].
14TH IEEE INTERNATIONAL ON-LINE TESTING SYMPOSIUM, PROCEEDINGS,
2008,
:123-+
[5]
[Anonymous], P INT S COMP ARCH SA
[6]
[Anonymous], 2009, Reliability, Wearout Mechanisms in Advanced CMOS Technologies
[9]
Blome J., 2006, P WORKSH ARCH REL