A New Method for SSD Black-box Performance Test

被引：0
作者：
Xie, Qiyou [1 ]
机构：
[1] Natl Univ Def Technol, Coll Elect Sci & Engn, Deya St 109, Changsha 410073, Hunan, Peoples R China
来源：
2017 PROGRESS IN ELECTROMAGNETICS RESEARCH SYMPOSIUM - SPRING (PIERS) | 2017年
关键词：
MEMORY TECHNOLOGIES; FLASH MEMORY; FUTURE;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In the past decade, NAND Flash has stood out from numerous non-volatile storage mediums. The NAND Flash based Solid State Disk (SSD) has been widely used in many storing required fields such as embedded applications and data center. A new and efficient SSD black-box performance test method is revising in this paper. The designed test system contains time parameter getter, excitation signal generator, buffer unit, write/read controller and SSD. With the application of the proposed method, not only the influence of TRIM mechanism could been analyzed, but also the test precision is increased significantly. To verify the validity and performance of our test system, the IOPS, response time and write/read bandwidth of the universal testing software (IOMETER, HDTUNE, etc.) and SATA protocol analyzer are presented and compared with our method in detail.
引用
收藏
页码：1116 / 1122
页数：7
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