Theoretical model for film thickness dependent gas sensitivity variation in nanocrystalline tin oxide sensor

被引：0
作者：
Shukla, S
Seal, S
机构：
[1] Univ Cent Florida, Mech Mat Aerosp & Engn Dept, Orlando, FL 32816 USA
[2] Univ Cent Florida, Adv Mat Proc & Anal Ctr, Orlando, FL 32816 USA
来源：
SENSOR LETTERS | 2004年 / 2卷 / 3-4期
关键词：
nanocrystalline; tin oxide; gas senor; film thickness; model;
D O I：
10.1166/sl.2004.059
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
A new theoretical model has been proposed in this analysis to explain the experimentally observed gas sensitivity variation in nanocrystalline tin oxide (SnO2) thin film sensor as a function of film thickness. Excellent agreement between the theoretical prediction. and some of the experimental results reported in the literature has been observed. The present theoretical model also overcomes the limitations of the earlier models.
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页码：260 / 264
页数：5
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