Improved built-in self-test of sequential circuits

被引：0
作者：
Jabbari, Hosna [1 ]
Muzio, Jon C. [2 ]
Sun, Lin [2 ]
机构：
[1] Univ British Columbia, Dept Comp Sci, Vancouver, BC V6T 1W5, Canada
[2] Univ Victoria, Dept Comp Sci, Victoria, BC V8W 2Y2, Canada
来源：
2007 CANADIAN CONFERENCE ON ELECTRICAL AND COMPUTER ENGINEERING, VOLS 1-3 | 2007年
关键词：
D O I：
暂无
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
In this paper, we present a new class of one-dimensional cellular automata (which can be considered as a special case of a two dimensional cellular automata) that shows better pseudo-randomness properties based on Knuth's empirical tests than linear hybrid cellular automata and linear feedback shift register. A theorem is given to calculate the number of distinct transitions and the effectiveness of our proposed cellular automata is investigated by using them as test pattern generators for built-in self-test of the ISCAS 89 benchmark circuits. Our experimental results show that our cellular automata produce better sequential fault coverage than linear feedback shift register and linear hybrid cellular automata.
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页码：78 / 81
页数：4
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