Optical, dosimetric, and scintillation properties of pure sapphire crystals

被引:13
作者
Futami, Yoshisuke [1 ]
Yanagida, Takayuki [2 ]
Fujimoto, Yutaka [2 ]
机构
[1] Kumamoto Natl Coll Technol, Kumamoto 8668501, Japan
[2] Kyushu Inst Technol, Kitakyushu, Fukuoka 8080196, Japan
关键词
SI STRIP DETECTOR; HXD-II; ONBOARD ASTRO-E2; LUMINESCENCE; AL2O3-C; ZNO; GAN;
D O I
10.7567/JJAP.53.02BC12
中图分类号
O59 [应用物理学];
学科分类号
摘要
Optical, dosimetric, and scintillation properties of undoped sapphire (Al2O3) single crystals fabricated by different methods of the Czochralski (Cz) and the Bridgman were investigated. In X-ray induced radioluminescence spectra, they showed emission peaks at 240 and 300 nm due to exciton and F+ centers, respectively. Scintillation decay times of F+ center was fast around few ns. As a dosimetric property, from 0.01 to 2 Gy X-ray was exposed to them and they exhibited a thermally stimulated luminescence (TSL) with a good linearity. The glow peaks of them were similar, 150, 250, and 325 degrees C. In TSL, the Bridgeman sample represented only F+-center emission while the Cz sample showed F at 400 nm and F+ at 300 nm centers emission. (C) 2014 The Japan Society of Applied Physics
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页数:4
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