Fluorescence quantum yield of CdSe/ZnS nanocrystals investigated by correlated atomic-force and single-particle fluorescence microscopy

被引:192
作者
Ebenstein, Y
Mokari, T
Banin, U [1 ]
机构
[1] Hebrew Univ Jerusalem, Inst Chem, IL-91904 Jerusalem, Israel
[2] Hebrew Univ Jerusalem, Ctr Nanosci & Nanotechnol, IL-91904 Jerusalem, Israel
关键词
D O I
10.1063/1.1482785
中图分类号
O59 [应用物理学];
学科分类号
摘要
Correlated atomic-force and fluorescence microscopy are used to study single-particle versus ensemble fluorescence quantum yields (QY) of semiconductor nanocrystals by measuring a simultaneous map of the topography and the single-particle fluorescence. CdSe/ZnS nanocrystal quantum dots and quantum rods with high QY were investigated. A significant portion of dark particles is detected. Comparison with the ensemble solution QY shows that samples with higher QY have a larger fraction of bright particles accompanied by an increased single-particle QY. Saturated emission from single nanocrystals could not be detected because of particle darkening under high-power excitation. (C) 2002 American Institute of Physics.
引用
收藏
页码:4033 / 4035
页数:3
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