Scanning SQUID Microscopy of flux distributions and motion near surface features in NbSe2

被引:0
|
作者
Plourde, BLT [1 ]
Van Harlingen, DJ [1 ]
机构
[1] Univ Illinois, Dept Phys, Urbana, IL 61801 USA
来源
PHYSICS AND MATERIALS SCIENCE OF VORTEX STATES, FLUX PINNING AND DYNAMICS | 1999年 / 356卷
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中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Scanning SQUID Microscopy (SSM) can provide reasonable spatial resolution and unparalleled flux sensitivity for imaging magnetic flux patterns. This makes the SSM useful for studying vortex behavior around defect structures in superconducting thin films and crystals. We have used an SSM to image flux distributions and to study vortex dynamics around surface steps in the superconductor NbSe2.
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页码:281 / 290
页数:10
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