Narrow sense heritability estimates of bacterial leaf spot resistance in pseudo F2 (F1) population of mulberry (Morus spp.)

Bacterial leaf spot incited by Xanthomonas campestris pv. mori is a devastating foliar disease of mulberry reported globally. Host plant resistance is the most sustainable and economic control measure but so far unexplored. Highly heterozygous plant behaviour and scant genetic information of bacterial leaf spot resistance limits a targetted breeding approach in mulberry. In the present research eight pseudo-F-2(F-1)full-sib progenies derived from selected resistant and susceptible sources were evaluated symptomatically for bacterial leaf spot resistance under natural disease occurrence in 2008 and 2009. Significant variation for bacterial leaf spot resistance was observed in the parents and progenies. Broad sense heritability estimate (0.9) indicates that selection of resistant genotypes can be useful for exploitation in future advanced breeding programs for mulberry. High narrow sense heritability estimates (0.76)[2008] and (0.79)[2009] suggest additive gene effects for the disease resistant trait. The continuous frequency distribution of diseases severity across the progenies indicates that bacterial leaf spot resistance in mulberry may be inherited quantitatively.