Low Temperature Improvement Method on Zn:SiOx Resistive Random Access Memory Devices

被引:31
作者
Chang, Kuan-Chang [1 ]
Tsai, Tsung-Ming [1 ]
Chang, Ting-Chang [2 ,3 ]
Wu, Hsing-Hua [4 ,5 ]
Chen, Kai-Huang [6 ]
Chen, Jung-Hui [7 ]
Young, Tai-Fa [8 ]
Chu, Tian-Jian [1 ]
Chen, Jian-Yu [2 ,3 ]
Pan, Chih-Hung [1 ]
Su, Yu-Ting [2 ,3 ]
Syu, Yong-En [2 ,3 ]
Tung, Cheng-Wei [1 ]
Chang, Geng-Wei [4 ,5 ]
Chen, Min-Chen [2 ,3 ]
Huang, Hui-Chun [1 ]
Tai, Ya-Hsiang [4 ,5 ]
Gan, Der-Shin [1 ]
Wu, Jia-Jie [9 ]
Hu, Ying [9 ]
Sze, Simon M. [2 ,10 ]
机构
[1] Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 804, Taiwan
[2] Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, Taiwan
[3] Natl Cheng Kung Univ, Adv Optoelect Technol Ctr, Tainan 70101, Taiwan
[4] Natl Chiao Tung Univ, Dept Photon, Hsinchu 30050, Taiwan
[5] Natl Chiao Tung Univ, Inst Electroopt Engn, Hsinchu 30050, Taiwan
[6] Tung Fang Design Univ, Dept Elect Engn & Comp Sci, Kaohsiung 807, Taiwan
[7] Natl Kaohsiung Normal Univ, Dept Chem, Kaohsiung 80543, Taiwan
[8] Natl Sun Yat Sen Univ, Dept Mech & Electromech Engn, Kaohsiung 804, Taiwan
[9] Xidian Univ, Sch Tech Phys, Xian 710071, Peoples R China
[10] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 30050, Taiwan
关键词
Nonvolatile memory; resistive switching; silicon oxide; zinc; RRAM;
D O I
10.1109/LED.2013.2248075
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
To improve the resistive switching properties of the resistive random access memory (RRAM), the supercritical carbon dioxide (SCCO2) fluid is used as a low temperature treatment. In this letter, the Zn:SiOx thin films are treated by SCCO2 fluid mixed with pure water. After SCCO2 fluid treatment, the resistive switching qualities of the Zn:SiOx thin films are carried out by XPS, fourier transform infrared spectroscopy, and IV measurement. We believe that the SCCO2-treated Zn:SiOx thin film is a promising material for RRAM applications due to its compatibility with portable flat panel display.
引用
收藏
页码:511 / 513
页数:3
相关论文
共 12 条
  • [1] [Anonymous], APPL PHYS LETT
  • [2] The Effect of Silicon Oxide Based RRAM with Tin Doping
    Chang, Kuan-Chang
    Tsai, Tsung-Ming
    Chang, Ting-Chang
    Syu, Yong-En
    Chuang, Siang-Lan
    Li, Cheng-Hua
    Gan, Der-Shin
    Sze, Simon M.
    [J]. ELECTROCHEMICAL AND SOLID STATE LETTERS, 2012, 15 (03) : H65 - H68
  • [3] A low-temperature method for improving the performance of sputter-deposited ZnO thin-film transistors with supercritical fluid
    Chen, Min-Chen
    Chang, Ting-Chang
    Huang, Sheng-Yao
    Chang, Kuan-Chang
    Li, Hung-Wei
    Chen, Shih-Ching
    Lu, Jin
    Shi, Yi
    [J]. APPLIED PHYSICS LETTERS, 2009, 94 (16)
  • [4] Resistive Switching Properties of Au/ZrO2/Ag Structure for Low-Voltage Nonvolatile Memory Applications
    Li, Yingtao
    Long, Shibing
    Zhang, Manhong
    Liu, Qi
    Shao, Lubing
    Zhang, Sen
    Wang, Yan
    Zuo, Qingyun
    Liu, Su
    Liu, Ming
    [J]. IEEE ELECTRON DEVICE LETTERS, 2010, 31 (02) : 117 - 119
  • [5] Improvement of Resistive Switching Properties in ZrO2-Based ReRAM With Implanted Ti Ions
    Liu, Qi
    Long, Shibing
    Wang, Wei
    Zuo, Qingyun
    Zhang, Sen
    Chen, Junning
    Liu, Ming
    [J]. IEEE ELECTRON DEVICE LETTERS, 2009, 30 (12) : 1335 - 1337
  • [6] Redox Reaction Switching Mechanism in RRAM Device With Pt/CoSiOX/TiN Structure
    Syu, Yong-En
    Chang, Ting-Chang
    Tsai, Tsung-Ming
    Hung, Ya-Chi
    Chang, Kuan-Chang
    Tsai, Ming-Jinn
    Kao, Ming-Jer
    Sze, Simon M.
    [J]. IEEE ELECTRON DEVICE LETTERS, 2011, 32 (04) : 545 - 547
  • [7] Low-temperature method for enhancing sputter-deposited HfO2 films with complete oxidization
    Tsai, Chih-Tsung
    Chang, Ting-Chang
    Liu, Po-Tsun
    Yang, Po-Yu
    Kuo, Yu-Chieh
    Kin, Kon-Tsu
    Chang, Pei-Lin
    Huang, Fon-Shan
    [J]. APPLIED PHYSICS LETTERS, 2007, 91 (01)
  • [8] Origin of Hopping Conduction in Sn-Doped Silicon Oxide RRAM With Supercritical CO2 Fluid Treatment
    Tsai, Tsung-Ming
    Chang, Kuan-Chang
    Chang, Ting-Chang
    Chang, Geng-Wei
    Syu, Yong-En
    Su, Yu-Ting
    Liu, Guan-Ru
    Liao, Kuo-Hsiao
    Chen, Min-Chen
    Huang, Hui-Chun
    Tai, Ya-Hsiang
    Gan, Der-Shin
    Ye, Cong
    Wang, Hao
    Sze, Simon M.
    [J]. IEEE ELECTRON DEVICE LETTERS, 2012, 33 (12) : 1693 - 1695
  • [9] Bipolar Resistive RAM Characteristics Induced by Nickel Incorporated Into Silicon Oxide Dielectrics for IC Applications
    Tsai, Tsung-Ming
    Chang, Kuan-Chang
    Chang, Ting-Chang
    Syu, Yong-En
    Chuang, Siang-Lan
    Chang, Geng-Wei
    Liu, Guan-Ru
    Chen, Min-Chen
    Huang, Hui-Chun
    Liu, Shih-Kun
    Tai, Ya-Hsiang
    Gan, Der-Shin
    Yang, Ya-Liang
    Young, Tai-Fa
    Tseng, Bae-Heng
    Chen, Kai-Huang
    Tsai, Ming-Jinn
    Ye, Cong
    Wang, Hao
    Sze, Simon M.
    [J]. IEEE ELECTRON DEVICE LETTERS, 2012, 33 (12) : 1696 - 1698
  • [10] Dehydroxyl effect of Sn-doped silicon oxide resistance random access memory with supercritical CO2 fluid treatment
    Tsai, Tsung-Ming
    Chang, Kuan-Chang
    Chang, Ting-Chang
    Syu, Yong-En
    Liao, Kuo-Hsiao
    Tseng, Bae-Heng
    Sze, Simon M.
    [J]. APPLIED PHYSICS LETTERS, 2012, 101 (11)