Frequency-shifted Mach-Zehnder interferometer for locating multiple weak reflections along a fiber link

被引:19
作者
Qi, B
Qian, L
Tausz, A
Lo, HK
机构
[1] Univ Toronto, Dept Phys, Toronto, ON M5S 1A7, Canada
[2] Univ Toronto, Dept Elect & Comp Engn, Toronto, ON M5S 3G4, Canada
[3] Univ Toronto, Dept Phys, Toronto, ON M5S 3G4, Canada
基金
加拿大创新基金会; 加拿大自然科学与工程研究理事会;
关键词
Discrete Fourier transforms (DFTs); optical fiber measurements; optical interferometry; phase-locked amplifiers;
D O I
10.1109/LPT.2005.861995
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We propose and demonstrate a novel technique for measuring fiber lengths and locating multiple weak reflections along the fiber using a low-cost continuous wave source, a folded Mach-Zehnder interferometer (MZI), and a frequency shifter. By sweeping the frequency of the shifter, which is located in one path of the MZI, the optical length of the test fiber can be determined precisely from the interference pattern constructed by the reflected signals from the fiber end. Experimentally, for fibers shorter than 10 km, the standard deviations are less than 1 mm. Furthermore, by incorporating lock-in detection and fast Fourier transform techniques, both the locations and the reflectance of multiple reflection sites along one fiber can be resolved with a spatial resolution of about 5 m and a sensitivity better than -67 dB. This could be a powerful interrogating technique for optical fiber sensor arrays.
引用
收藏
页码:295 / 297
页数:3
相关论文
共 6 条
[1]  
BARMOSKI MK, 1977, APPL OPTICS, V16, P2375
[2]   Low-coherent WDM reflectometry for accurate fiber length monitoring [J].
Hui, R ;
Thomas, J ;
Allen, C ;
Fu, B ;
Gao, S .
IEEE PHOTONICS TECHNOLOGY LETTERS, 2003, 15 (01) :96-98
[3]   IN-SERVICE FIBER LINE IDENTIFICATION BASED ON HIGH-RESOLUTION FIBER LENGTH MEASUREMENT [J].
KATSUYAMA, Y .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1995, 13 (01) :6-13
[4]  
NEWLAND DE, 1993, INTRO RANDOM VIBRATI, pCH10
[5]   EXPERIMENTAL AND THEORETICAL INVESTIGATIONS OF COHERENT OFDR WITH SEMICONDUCTOR-LASER SOURCES [J].
PASSY, R ;
GISIN, N ;
VONDERWEID, JP ;
GILGEN, HH .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1994, 12 (09) :1622-1630
[6]   OPTICAL COHERENCE-DOMAIN REFLECTOMETRY - A NEW OPTICAL EVALUATION TECHNIQUE [J].
YOUNGQUIST, RC ;
CARR, S ;
DAVIES, DEN .
OPTICS LETTERS, 1987, 12 (03) :158-160