Production of thin epitaxial films using ion beam deposition

被引:0
作者
Gorris, F
Krug, C
Kubsky, S
Baumvol, IJR [1 ]
Schulte, WH
Rolfs, C
机构
[1] UFRGS, Inst Fis, BR-91509900 Porto Alegre, RS, Brazil
[2] Ruhr Univ Bochum, Inst Expt Phys 3, D-44780 Bochum, Germany
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1999年 / 173卷 / 01期
关键词
D O I
10.1002/(SICI)1521-396X(199905)173:1<167::AID-PSSA167>3.0.CO;2-G
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An ion beam deposition system to produce isotopically pure epitaxial thin films of different materials has been designed and built. Using negative ions, problems due to mass interference with molecular ions could be significantly reduced, thus allowing the production, for instance, of Si-29 films of high purity. By including thermal processing and different analytical facilities to this system, in-situ studies of atomic transport as well as atomic exchange processes can be studied directly.
引用
收藏
页码:167 / 173
页数:7
相关论文
共 10 条
  • [1] APPLETON BR, 1987, MRS BULL, V52, P532
  • [2] Thermal nitridation of SiO2 films in ammonia - Isotopic tracing of nitrogen and oxygen in the initial stages
    Baumvol, IJR
    Stedile, FC
    Ganem, JJ
    Trimaille, I
    Rigo, S
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (09) : 2938 - 2945
  • [3] Isotopic tracing of Si during thermal growth of Si3N4 ultrathin films
    Baumvol, IJR
    Borucki, L
    Chaumont, J
    Ganem, JJ
    Kaytasov, O
    Piel, N
    Rigo, S
    Schulte, WH
    Stedile, FC
    Trimaille, I
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 118 (1-4) : 499 - 504
  • [4] Garfunkel E., 1998, FUNDAMENTAL ASPECTS
  • [5] GORRIS F, 1998, THESIS RUHR U BOCHUM
  • [6] GROWTH-MECHANISM OF THIN SILICON-OXIDE FILMS ON SI(100) STUDIED BY MEDIUM-ENERGY ION-SCATTERING
    GUSEV, EP
    LU, HC
    GUSTAFSSON, T
    GARFUNKEL, E
    [J]. PHYSICAL REVIEW B, 1995, 52 (03) : 1759 - 1775
  • [7] Concept and status of the new sample preparation and analyzing facility at Bochum
    Kubsky, S
    Borucki, L
    Berheide, M
    Baier, S
    Becker, HW
    Gorris, F
    Grunwald, C
    Gutt, T
    Kruger, G
    Mehrhoff, M
    Piel, N
    Schulte, WH
    Rolfs, C
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1996, 113 (1-4) : 63 - 66
  • [8] KUBSKY S, IN PRESS
  • [9] Gamma-ray detection with a 4π NaI spectrometer for material analysis
    Mehrhoff, M
    Aliotta, M
    Baumvol, IJR
    Becker, HW
    Berheide, M
    Borucki, L
    Domke, J
    Gorris, F
    Kubsky, S
    Piel, N
    Roters, G
    Rolfs, C
    Schulte, WH
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 132 (04) : 671 - 684
  • [10] VRCKOVNIK G, 1990, P INT JOINT C NEURAL, V1, P45