Thermal stability and magnetization switching in perpendicular magnetic tunnel junctions

被引:16
|
作者
Volvach, I. [1 ,2 ]
Alzate, J. G. [3 ]
Chen, Y. -J. [3 ]
Smith, A. J. [3 ]
Kencke, D. L. [3 ]
Lomakin, V. [1 ,2 ]
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, La Jolla, CA 92093 USA
[2] Ctr Memory & Recording Res, La Jolla, CA 92093 USA
[3] Intel Corp, Hillsboro, OR 97124 USA
关键词
D O I
10.1063/5.0005211
中图分类号
O59 [应用物理学];
学科分类号
摘要
A micromagnetic study of the thermal stability and magnetization switching by spin-polarized current in Perpendicular Magnetic Tunnel Junctions comprising a four-layer stack of free layer, reference layer, and synthetic antiferromagnets is presented. It is demonstrated that the minimal energy path (MEP)-related to the thermal stability of the system-does not necessarily follow the same trajectory as the currentinduced switching. The MEP can be by uniform rotation (UR) or by domain walls (DWs), whereas the current-induced switching can be by UR, DWs, or bubble formation depending on geometrical and stack parameters. The bubble formation is further affected by the direction of switching, i.e., parallel to antiparallel vs antiparallel to parallel switching. We demonstrate the existence of different regimes where the energy barrier and the figure of merit, defined as a ratio between the energy barrier and switching current, show characteristic dependencies and even optimum points depending on the device diameter and the stack parameters. The presented results may explain recent experiments. Published under license by AIP Publishing.
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页数:4
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