Measurement Accuracy Enhancement in Six-Port Reflectometers

被引：5

作者：

Staszek, Kamil ^{[1
]}

Gruszczynski, Slawomir ^{[1
]}

Wincza, Krzysztof ^{[1
]}

机构：

[1] AGH Univ Sci & Technol, PL-30059 Krakow, Poland

来源：

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS | 2015年 / 25卷 / 08期

关键词：

Measurement accuracy; power measurement uncertainty; reflection coefficient measurement; six-port reflectometer; CALIBRATION; DESIGN;

D O I：

10.1109/LMWC.2015.2440784

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new algorithm improving measurement accuracy in six-port reflectometers, applicable also for arbitrary multiport reflectometers, is proposed. The developed procedure does require neither additional measurements nor modifications of the measuring system. The introduced weighting coefficients allow for enhancement of the measurement accuracy using the same power measurements as in classic solutions. The proposed theory has been confirmed experimentally by the measurements of reflection coefficient within a wide frequency range 2-4 GHz.

引用

收藏

页码：553 / 555

页数：3

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